CTAS1000_Mesa晶片厚度量測&分類(Mesa Blank Thickness Measurement & Sorting)
晶片厚度量測及瑕疵檢查&分類機
Mesa Blank thickness measurement and defect inspection & classification machine
|
Technical Items |
Data |
|
Controller |
Win10 / IPC CPU I3/I5 |
|
Dimensions |
W1000xL750XH1600 |
|
Blank Size |
□7050,6035,5032 |
|
Index time(Dry Run) |
1.8~2.0s |
|
Loader |
□Scattered Tray |
|
Unloader |
□Box |
|
Pick & Place Nozzle |
R=Single / L=Single |
|
CCD AOI Function |
□尺寸量測 |
Scattered Tray→Search CCD→Down CCD(Alignment)→Index→XXX check→AOI CCD
→Sorting Bin1~100